device_making
Differences
This shows you the differences between two versions of the page.
Next revision | Previous revision | ||
device_making [2019/09/09 20:40] – created ethanminot | device_making [2022/09/13 11:23] (current) – dublin | ||
---|---|---|---|
Line 2: | Line 2: | ||
The key steps of fabricating devices for carbon-based nanoelectronics are: | The key steps of fabricating devices for carbon-based nanoelectronics are: | ||
- | *[[graphene fabrication|graphene | + | *[[graphene fabrication|Graphene |
- | *[[nanotube | + | *[[Nanotube |
+ | *[[Photolithography]] | ||
+ | *[[ebeam_litho|E-beam lithography at OSU]] | ||
+ | *[[ebeam_recipe|E-beam lithography at UO]] | ||
*Microfabrication (see below) | *Microfabrication (see below) | ||
Line 17: | Line 20: | ||
{{:: | {{:: | ||
All experimental physicists working in this field have to learn [[best practices for handling chips]]. | All experimental physicists working in this field have to learn [[best practices for handling chips]]. | ||
+ | |||
+ | |||
+ | ===== Photolithography ===== | ||
+ | |||
+ | Uses chrome masks to expose photoresist. See [[Photolithography]] | ||
===== Mask design ===== | ===== Mask design ===== | ||
Line 26: | Line 34: | ||
^DWL Costs^ | | ^DWL Costs^ | | ||
- | |Laser time|$6/hour| | + | |Laser time|$9/hour| |
- | |Mask blank|$12| | + | |Mask blank|$20| |
- | |developer/ | + | |developer/ |
Before the DWL was installed on campus we had to send CAD drawings to a [[purchasing supplies|mask making company]]. Commerically produced chrome masks cost $400 - 800 each. | Before the DWL was installed on campus we had to send CAD drawings to a [[purchasing supplies|mask making company]]. Commerically produced chrome masks cost $400 - 800 each. | ||
Line 37: | Line 45: | ||
For less demanding resolution, for example 10-20 micron minimum feature size, a [[mylar masks|printed transparency]] can be used. These masks cost about $60 each and are purchased from a company in Bandon. Now we prefer to make chrome masks in the DWL. | For less demanding resolution, for example 10-20 micron minimum feature size, a [[mylar masks|printed transparency]] can be used. These masks cost about $60 each and are purchased from a company in Bandon. Now we prefer to make chrome masks in the DWL. | ||
- | =====Photolithography===== | ||
- | We are using shared equipment in John Wager' | ||
- | The most important source | + | Some tips for a successful mask design: |
+ | * start with an outline | ||
+ | * use text to label your mask (is it a part of a set? use "Mask 1/4", etc. Also may include your name/lab name, date, the mask name, mask type. For example, "Carly Fengel, Minot Group, 8/2019, FDM Design #2, Graphene Mask, 2/3") | ||
+ | * minimize the total area occupied by the mask design and text to decrease write time. The mask writer will put a rectangle around the area containing your design and visit each pixel within that rectangle. The smaller this rectangle, the faster the write time (note that the write time is independent of how much of the mask is exposed vs how much is not). | ||
+ | * include alignment marks for masks in a set. Think carefully about the positive and negative space for each layer; you need to be able to see the alignment mark on the chip underneath and the one on the current mask simultaneously. | ||
+ | * if your mask is going to be mostly chrome with only small open regions, consider adding a clear outline a few mm thick around your design. Otherwise you won't be able to see the edges of the chip underneath which will make it difficult to print the design where you want it on the chip. | ||
+ | * if your design is symmetric or on a clear substrate, put an " | ||
+ | * use the metal layer to mark other useful features on the chip design. For example, you can label device sites with coordinates or letters, or use brackets to indicate the location of graphene sites to help create a " | ||
+ | * You can make smaller " | ||
- | [[Contact Aligner Walk Thru]] | ||
- | |||
- | === Photoresist processing recipe === | ||
- | //(updated 04-08-2010)// | ||
- | *5 min dehydration bake 190°C | ||
- | *spin LOR3B photoresist at 4000 rpm for 45 sec (//bilayer process only//) | ||
- | * Deposits ~250 nm of photoresist (according to LOR3B documentation) | ||
- | * ideal LOR3B thickness = 1.25*metal thickness | ||
- | * //Skip this step for single layer process// | ||
- | *4 min softbake 190°C (//bilayer process only//) | ||
- | * //Skip this step for single layer process// | ||
- | *spin S1813 photoresist at 4000 rpm for 30 sec | ||
- | *2 min softbake 115°C | ||
- | *6 sec exposure | ||
- | *45 sec develop | ||
- | * Developing solution: 4 parts DI H20, 1 part Shipley Mircoposit MF-351 | ||
- | * Gently agitate substrate in developer bath. Afterward, gently spray rinse DI H2O followed by a quick dunk in a DI H20 bath with some agitation. | ||
- | *deposit 35nm metal | ||
- | *remove underlayer with mircoposit 1165 (located in Weniger 306 lab) | ||
- | * Put chips in 60°C remover for 30 min | ||
- | * Transfer to fresh 60°C remover for 30 min | ||
- | *rinse DI H20 then blow dry | ||
- | * Never rinse chip with acetone while LOR3B or it's residue is still on the chip! The LOR3B combines with acetone to form a sludge that can only be removed by scraping! | ||
- | |||
- | ===Other recipes=== | ||
- | *[[Pre-2010 Recipes]] | ||
- | *[[Eric Sundholm' | ||
- | |||
- | ===Cross contamination=== | ||
- | * Be extremely careful when using CD-26 & MF-351 in the same lab. One drop of MF-351 in a gallon of CD-26 ruins the whole gallon! This problem was so bad that Shipley built a separate facility just to keep these away from each other. | ||
- | |||
- | ===Photoresist removal=== | ||
- | Matt has documented that hot PR remover leaves less PR residue than any other method we have tried. | ||
===== Ebeam lithography ===== | ===== Ebeam lithography ===== | ||
Line 80: | Line 61: | ||
In September 2011 the new ebeam lithography system was installed in the OSU Electron Microscopy Facility. Doug Kezsler' | In September 2011 the new ebeam lithography system was installed in the OSU Electron Microscopy Facility. Doug Kezsler' | ||
+ | |||
===== Cleaving & Dicing Wafers ===== | ===== Cleaving & Dicing Wafers ===== | ||
The initial photolithography steps are done on 3" wafers. To grow nanotubes, however, we have to [[ | The initial photolithography steps are done on 3" wafers. To grow nanotubes, however, we have to [[ | ||
http:// | http:// | ||
- | The only way to get truly square quartz pieces is to use a wafer dicing saw. Pallavi Dhagat has used [[http:// | + | The only way to get truly square quartz pieces is to use a wafer dicing saw. There is one available in the OSU Cleanroom. |
===== Metal deposition ===== | ===== Metal deposition ===== | ||
===Thermal evaporation=== | ===Thermal evaporation=== | ||
Line 97: | Line 80: | ||
Thin film deposition is monitored by a [[http:// | Thin film deposition is monitored by a [[http:// | ||
- | For thermal | + | For thermal |
This [[http:// | This [[http:// | ||
Line 132: | Line 115: | ||
*Reactive Ion Etching, $30 per hour, need about a 30 minute session to do 500 nm etch. | *Reactive Ion Etching, $30 per hour, need about a 30 minute session to do 500 nm etch. | ||
- | ======Device Fabrication: | + | ====== |
==Overview of GFET Fabrication== | ==Overview of GFET Fabrication== | ||
Line 173: | Line 156: | ||
- | ==Photolithography Procedures (in OSU cleanroom)== | + | |
- | (I) Spin-coating | + | |
- | -For bilayer processing (metal deposition) complete all steps below | + | |
- | -For single layer processing (graphene) skip steps 3 – 5 | + | |
- | (1) Place chip on hotplate at 115 C for about 3 minutes to remove any residual water. Cool chip on cooling plate for 1 minute. | + | |
- | (2) Set spinner to 4000 RPM (ramp rate = 1000 R/s). | + | |
- | (3) Cleanly pipette P20 and drop onto chip; wait about 30 s. for solution to spread. Spin for 45 s. | + | |
- | (4) Cleanly pipette LOR onto center of chip. Immediately spin for 45 s. | + | |
- | (5) Place chip on hotplate at 190 C for 4 minutes (hard bake). Cool for 1 minute. | + | |
- | (6) Cleanly pipette S1813 onto center of chip. Immediately spin for 30 s. | + | |
- | (7) Place chip on hotplate at 115 C for 90 s (hard bake). Cool for 1 minute. | + | |
- | (II) Exposure | + | |
- | -Using ECE418 aligner | + | |
- | (1) Check N2 and compressed air pressure (gauges near door; expect about 40 psi and 80 psi, respectively). | + | |
- | (2) Turn on N2, compressed air, and bulb. Set power to 350 W, constant power. Let bulb warm up for 15 minutes. Note: warning light will blink for about 1 minute. If it blinks longer the bulb needs to be replaced. | + | |
- | (3) Carefully insert mask, with purple (chrome) side facing sample. Add chip and align properly. Exposure time is 3 – 4 s. | + | |
- | (4) After exposure, remove mask. Turn off bulb but leave N2 on until system is cool (30 minutes). If necessary, clean mask with acetone/ | + | |
- | (III) Development | + | |
- | -Note S1813 is a positive photo-resist so exposure breaks bonds, allowing it to be washed away with developer | + | |
- | (1) Place chip in AZ300 bath for 90 s., constantly agitating. | + | |
- | (2) Remove from developer bath and put into water for 60 s, agitating. | + | |
- | (3) Dry with N2. | + | |
==Plasma-etch Procedures== | ==Plasma-etch Procedures== |
device_making.1568086854.txt.gz · Last modified: 2019/09/09 20:40 by ethanminot